• Scanning Electron Microscope (SEM)
  • Overview

Scanning Electron Microscope (SEM)

The Phenom ProX SEM has both optical and electron microscopes capable of magnifications up to 135x and 150,000x, respectively. Electron beam modes are 5 kV, 10 kV, and 15 kV. The SEM has built-in EDS for elemental analysis and mapping. Setup is extremely fast and simple, allowing users to take SEM images in minutes. A benchtop sputter coater is available for coating samples with gold.